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Effect of the TiN content in the Pd–TiN seed layer on the microstructure and magnetic properties of Co∕Pd multilayered media

机译:Pd-TiN种子层中TiN含量对Co ∕ Pd多层介质的微观结构和磁性能的影响

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摘要

[Co(0.2 nm)∕Pd(0.8 nm)]20 multilayered films on 15 nm Pd–TiN seed layers were fabricated by dc magnetron sputtering without heating the substrate. The effects of TiN content on microstructure and magnetic properties of the [Co∕Pd] multilayered media were studied. By increasing the TiN content in the Pd–TiN seed layer to an optimum level, coercivity of the [Co∕Pd] multilayered media increased to 6.7 kOe. However, further increase of TiN content beyond 22 vol % reduced coercivity (Hc), implying that there exists a critical TiN concentration to enhance the magnetic property of the [Co∕Pd] multilayered media. Transmission electron microscopic observations revealed that well-isolated [Co∕Pd] multilayered grains with apparent grain boundaries were achieved by controlling the TiN content in the Pd–TiN seed layer. The average grain diameter was 8 nm with a dispersion of 11.2%, grown on the Pd–TiN seed layer with TiN content of 22 vol %.
机译:[Co(0.2 nm)∕ Pd(0.8 nm)]在15 nm Pd-TiN种子层上的20个多层膜是通过直流磁控溅射法制备的,无需加热基板。研究了TiN含量对[Co ∕ Pd]多层介质的微观结构和磁性能的影响。通过将Pd-TiN种子层中的TiN含量增加到最佳水平,[Co ∕ Pd]多层介质的矫顽力提高到6.7 kOe。但是,TiN含量进一步增加到超过22 vol%时,矫顽力(Hc)降低,这意味着存在临界TiN浓度以增强[Co ∕ Pd]多层介质的磁性能。透射电子显微镜观察表明,通过控制Pd–TiN晶种层中的TiN含量,可以得到具有良好晶界的良好隔离的[Co ∕ Pd]多层晶粒。在Pd-TiN晶种层上生长的平均晶粒直径为8 nm,分散度为11.2%,TiN含量为22 vol%。

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